首页> 外文会议>Conference on Testing, Reliability, and Applications of Optoelectronic Devices Jan 24-26, 2001, San Jose, USA >Reliability Assurance of Broad-Area, High-Power, Multimode Laser-Diodes for Telecommunications Equipment
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Reliability Assurance of Broad-Area, High-Power, Multimode Laser-Diodes for Telecommunications Equipment

机译:电信设备的广域,高功率,多模激光二极管的可靠性保证

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The procedure for demonstrating the reliability of laser diodes used in telecommunications equipment is documented in Telcordia document GR-468-CORE, Issue 1, December 1998. This procedure was intended for low-power single-mode diodes used in fiber-optic transmitters. A small section was added to the procedure to address high-power, single-mode diodes used as optical pumps for fiber amplifiers. Due to the invention of the double-clad fiber optic cavity, the next generation of fiber amplifiers will likely utilize high-power, multimode diode lasers as optical pumps. In this study, we report on the reliability assurance of multi-spatial mode laser diodes emitting 1 Watt from a 100 micron aperture at 915 nm. While additional study is required to verify the results, the present data indicate a total failure rate, combining both sudden and random failures, of less than 1000 FITs for an operational lifetime of 20 years.
机译:证明电信设备中使用的激光二极管的可靠性的过程在1998年12月发行的Telcordia文档GR-468-CORE(第1期)中进行了说明。该过程旨在用于光纤发射器中的低功率单模二极管。该过程中增加了一小部分,以解决用作光纤放大器的光泵的高功率单模二极管。由于双包层光纤腔的发明,下一代光纤放大器可能会使用高功率,多模二极管激光器作为光泵。在这项研究中,我们报告了从915 nm的100微米孔径发射1瓦功率的多空间模式激光二极管的可靠性保证。尽管还需要进行更多的研究来验证结果,但目前的数据表明,结合突发性和随机性故障,总故障率小于1000 FIT,使用寿命为20年。

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