首页> 外文会议>Conference on Photonics for Space Environments VIII, Jul 9-10, 2002, Seattle, Washington, USA >An Analysis of Charge Transfer Efficiency Noise on Proton-Damaged CCDs for the Hubble Space Telescope Wide Field Camera 3
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An Analysis of Charge Transfer Efficiency Noise on Proton-Damaged CCDs for the Hubble Space Telescope Wide Field Camera 3

机译:哈勃太空望远镜广角相机对质子损坏的CCD的电荷转移效率噪声的分析3

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Proton induced charge transfer efficiency (CTE) degradation has been studied in the large format charge-coupled device (CCD) flight-like candidates for Wide Field Camera 3 for the Hubble Space Telescope. These detectors were irradiated with different proton fluences. This paper focuses on the statistical nature of CTE degradation due to damage on one of the irradiated devices with exceptional initial CTE characteristics. In radiation damaged CCDs, CTE noise can be the dominant noise component. In contrast to other noise sources, CTE noise has a component of fixed pattern noise that can be removed by the appropriate calibration technique. A large set of data was acquired and analysis of it confirms the expectation that CTE damage is a local phenomenon and it varies widely across the CCD surface. Possible mitigation solutions and their practicality are discussed in some detail.
机译:在哈勃太空望远镜的广角相机3的大型电荷耦合器件(CCD)飞行状候选中,已经研究了质子感应的电荷转移效率(CTE)退化。用不同的质子注量辐照这些检测器。本文着重介绍由于具有一种特殊的初始CTE特性的受辐照设备损坏而导致的CTE退化的统计性质。在辐射损坏的CCD中,CTE噪声可能是主要的噪声成分。与其他噪声源相比,CTE噪声具有固定模式噪声的一部分,可以通过适当的校准技术将其消除。获得了大量数据,并对其进行分析,证实了人们期望CTE损坏是一种局部现象,并且在整个CCD表面上变化很大。详细讨论了可能的缓解措施及其实用性。

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