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TOMOGRAPHIC MICROINTERFEROMETRY OF REFRACTIVE INDEX DISTRIBUTION

机译:折光指数分布的层析微干涉。

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摘要

Tomographic microinterferometry allows for a fast determination of the 3D refractive index distribution in optical elements. In this paper the limitations of this method due to diffraction effects at the edges of microelements or the steps in refractive index distribution inside objects with dimensions comparable to the wavelength are experimentally analyzed and by FDTD based simulations of reconstruction process. The other limitation considered refers to the deviation from a straight light propagation condition assumed in tomographic reconstruction. This problem is analyzed on the base of an experimental analysis of a 3D refractive index distribution in gradient index fiber optics and grin lens. The further modifications of tomographic microinterferometry in order to decrease these limitations are discussed.
机译:断层扫描微干涉术允许快速确定光学元件中的3D折射率分布。在本文中,通过实验分析了基于微量元素边缘的衍射效应或尺寸与波长相当的物体内部折射率分布阶跃所导致的该方法的局限性,并通过基于FDTD的重建过程进行了仿真。所考虑的另一个限制是指与断层摄影重建中假定的直光传播条件的偏差。在对梯度折射率光纤和咧嘴透镜的3D折射率分布进行实验分析的基础上分析了此问题。为了减少这些局限性,讨论了层析显微干涉术的进一步改进。

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