首页> 外文会议>Conference on Optical Metrology in Production Engineering; 20040427-20040430; Strasbourg; FR >Fast Scanning Confocal Sensor provides High Fidelity Surface Profiles on a Microscopic Scale
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Fast Scanning Confocal Sensor provides High Fidelity Surface Profiles on a Microscopic Scale

机译:快速扫描共聚焦传感器可在微观尺度上提供高保真表面轮廓

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For a long time the confocal imaging technique was known to be a high precision imaging method in the field of microscopy providing unique depth discrimination properties, but suffering from slow response in connection with pointwise height detecting sensors. At the same time, it is obvious for triangulation systems to be unable to cope with the huge variety of shapes and specular surfaces in the continuous trend towards miniaturisation in electronics and micro machining. It is commonly understood that confocal height profiling usually requires a time consuming readjustment of the distance between the object and the sensor whilst scanning across a surface. Moreover, height steps on surfaces give rise to artefacts at the edges in many cases. In order to overcome these drawbacks we developed a high speed confocal sensor head, featuring a pixel data rate of 8000 Hz independent of surface steps and surface reflectivity. An essential feature is a fast focus scan in Z direction perpendicular to the object at a preset height measuring range. The focus adjustment is realised by scanning an image with a punctiform light source in conjunction with a punctiform detector utilizing a mirror which is attached to a high frequency mechanic oscillator. Both, the light source and the detector coincide at the end of a fibre. By moving the small sensor head relative to a surface a profile scan is taken. The time needed to determine the height value of one pixel and to measure its brightness is less than 125 microseconds. This high speed true confocal height detection technology opens up a new range of applications, e.g. in-line roughness, profile, displacement and coating thickness measurement as well as the profiling of holes where shading effects inhibit the use of triangulation based sensors.
机译:长期以来,共聚焦成像技术是显微镜领域中的一种高精度成像方法,具有独特的深度判别特性,但与点向高度检测传感器相关的响应速度较慢。同时,很明显,三角测量系统无法应对电子和微加工领域不断小型化的趋势,无法应对形状和镜面表面的多样性。通常应理解,共焦高度轮廓分析通常需要在扫描整个表面时耗时地重新调整对象与传感器之间的距离。而且,在许多情况下,表面上的高度台阶会在边缘产生伪影。为了克服这些缺点,我们开发了一种高速共焦传感器头,其像素数据速率为8000 Hz,与表面步长和表面反射率无关。一个基本功能是在预设的高度测量范围内沿垂直于对象的Z方向进行快速聚焦扫描。焦点调整是通过点状光源和点状检测器一起使用点状检测器扫描图像来实现的,该点状检测器使用了安装在高频机械振荡器上的镜子。光源和检测器都在光纤末端重合。通过相对于表面移动小传感器头,可以进行轮廓扫描。确定一个像素的高度值并测量其亮度所需的时间少于125微秒。这种高速真共焦高度检测技术开辟了新的应用范围,例如在线粗糙度,轮廓,位移和涂层厚度测量以及孔的轮廓分析,其中阴影效果会妨碍使用基于三角测量的传感器。

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