首页> 外文会议>Conference on Optical Metrology in Production Engineering; 20040427-20040430; Strasbourg; FR >Surface plasmon resonance heterodyne interferometry for measuring physical parameters
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Surface plasmon resonance heterodyne interferometry for measuring physical parameters

机译:用于测量物理参数的表面等离子体共振外差干涉法

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A light beam is incident on the boundary surface between the thin metal film of a surface-plasmon-resonance (SPR) apparatus and the test medium. If the incident angle is equal or very near to the resonant angle, then the phase difference between p- and s- polarizations of the reflected light is related to the associated physical parameter. The phase difference can be measured accurately by the heterodyne interferometry. If the relation between the phase difference and the associated physical parameter is specified, the associated physical parameter can be estimated with the data of the phase difference. This method has the advantages of both common-path interferometry and heterodyne interferometry.
机译:光束入射在表面等离子体共振(SPR)设备的金属薄膜与测试介质之间的边界表面上。如果入射角等于或非常接近谐振角,则反射光的p偏振和s偏振之间的相位差与关联的物理参数有关。可以通过外差干涉测量法精确地测量相位差。如果指定了相位差与关联的物理参数之间的关系,则可以利用相位差的数据来估计关联的物理参数。该方法具有共路径干涉测量法和外差干涉测量法的优点。

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