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Quantum tomography based on principles of completeness, adequacy and fidelity

机译:基于完整性,充分性和保真度原理的量子层析成像

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摘要

In this report we present a general approach for estimating quantum circuits by means of measurements. We apply thedeveloped general approach for estimating the quality of superconducting and optical quantum chips. Using the methodsof quantum states and processes tomography developed in our previous works, we have defined the adequate models ofthe states and processes under consideration.
机译:在这份报告中,我们提出了一种通过测量来估算量子电路的通用方法。我们采用已开发的通用方法来估计超导和光学量子芯片的质量。使用我们先前工作中开发的量子态和过程层析成像方法,我们定义了考虑中的状态和过程的适当模型。

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  • 来源
  • 会议地点 0277-786X;1996-756X
  • 作者单位

    Valiev Institute of Physics and Technology, Russian Academy of Sciences, Russian Federation National Research University of Electronic Technology (MIET), Russian Federation National Research Nuclear University (MEPhI), Russian Federation;

    Valiev Institute of Physics and Technology, Russian Academy of Sciences, Russian Federation National Research University of Electronic Technology (MIET), Russian Federation;

    Valiev Institute of Physics and Technology, Russian Academy of Sciences, Russian Federation National Research University of Electronic Technology (MIET), Russian Federation;

    Valiev Institute of Physics and Technology, Russian Academy of Sciences, Russian Federation National Research University of Electronic Technology (MIET), Russian Federation;

    Valiev Institute of Physics and Technology, Russian Academy of Sciences, Russian Federation;

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  • 正文语种 eng
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