首页> 外文会议>Conference on Instruments for Optics and Optoelectronic Inspection and Control 8-10 November 2000 Beijing, China >Study on grating angular displacement transducer using a Fabry-Perot structure and its performance improvement
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Study on grating angular displacement transducer using a Fabry-Perot structure and its performance improvement

机译:Fabry-Perot结构的光栅角位移传感器及其性能改进

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The Fabry-Perot interferometer (FPI) has been traditionally used to examine either small spectral ranges or relatively simple spectra. Recently, however, the studies have shown that the FPI can be competitive with the Michelson interferometer over extended spectral ranges. A relatively new FPI is described based on two gratings. In order to measure angular micro-displacement, a novel grating angular displacement tranducer using a multiplex Fabry-Perot interference technology has been developed in this paper.
机译:法布里-珀罗干涉仪(FPI)传统上已用于检查较小的光谱范围或相对简单的光谱。但是,最近的研究表明,FPI在扩展的光谱范围内可以与迈克尔逊干涉仪竞争。基于两个光栅描述了一个相对较新的FPI。为了测量角微位移,本文开发了一种使用多重法布里-珀罗干涉技术的新型光栅角位移传感器。

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