Inverse scattering of strongly scattering targets using redundant data sets

摘要

For weakly scattering permittivities, each measurement of the scattered far field can be interpreted as a sampling point of the Fourier transformation of the object. Furthermore, each sampling point can be accessed by more than one combination of wavelength, propagation direction, and polarization of the incident field. This means, a set of measurements which access the same sampling point can be regarded as being redundant. For strongly scattering objects the Fourier diffraction slice theorem does not apply. We show that measurements which are redundant in the weakly scattering case can be exploited to resolve difficulties associated with imaging of the strongly scattering objects. One dimensional geometries are investigated to estimate the potential redundant data sets offer for addressing the inverse scattering problem of strongly and multiply scattering objects. In addition, we discuss preliminary results for solving 2D imaging problems.