首页> 外文会议>Conference on High-Power Diode Laser Technology and Applications; 20080121-23; San Jose,CA(US) >650 nm tapered lasers with 1 W maximum output power and nearly diffraction limited beam quality at 500 mW
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650 nm tapered lasers with 1 W maximum output power and nearly diffraction limited beam quality at 500 mW

机译:650 nm锥形激光器,最大输出功率为1 W,在500 mW时几乎限制了光束质量

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High-brightness 650 nm tapered lasers with output powers up to 1 W and nearly diffraction limited beam quality at 500 mW were realized. The vertical structure is based on an InGaP single quantum well (SQW) embedded in AlGaInP waveguide layers and n-AlInP and p-AlGaAs cladding layers. The tapered structure consists of a 750 μm long ridge waveguide section and a 1.25 mm long flared section. Taper angles of 2°, 3° and 4° were manufactured. At 15℃, the devices achieve 1 W at an operating current below 2 A in CW operation. The conversion efficiency is about 20%. At 500 mW output power a nearly diffraction limited beam quality with a beam propagation ratio of about 1.5 was measured.The reliability was studied in a long-term test for five tapered diodes at 250 mW over 1,000 h and than at 500 mW over 2,000 h. All diodes survived this test. The beam quality remains nearly stable over the complete reliability test.
机译:实现了输出功率高达1 W的高亮度650 nm锥形激光器,并且在500 mW时几乎受到衍射限制。垂直结构基于嵌入在AlGaInP波导层以及n-AlInP和p-AlGaAs包层中的InGaP单量子阱(SQW)。锥形结构由750μm长的脊形波导段和1.25 mm长的喇叭形段组成。制造了2°,3°和4°的锥角。在15℃时,器件在连续波操作下的工作电流低于2 A时达到1W。转换效率约为20%。在500 mW的输出功率下,测量了近乎衍射极限的光束质量,光束传播比约为1.5。在5个锥形二极管的长期测试中,以1,000 m时的250 mW和在2,000 h时的500 mW的可靠性进行了可靠性测试。所有二极管均在该测试中幸存。在整个可靠性测试中,光束质量几乎保持稳定。

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