首页> 外文会议>Conference on Developments in Ⅹ-Ray Tomography Ⅲ, Aug 2-3, 2001, San Diego, USA >Magnified Hard X-Ray Microtomography: Toward Tomography with Sub-Micron Resolution
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Magnified Hard X-Ray Microtomography: Toward Tomography with Sub-Micron Resolution

机译:放大的硬X射线显微断层摄影术:朝着具有亚微米分辨率的层析成像

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摘要

Parabolic compound refractive lenses (PCRLs) are high quality imaging optics for hard x-rays that can be used as an objective lens in a new type of hard x-ray full field microscope. Using an aluminium PCRL, this new type of microscope has been shown to have a resolution of 350nm. Further improvement of the resolution down to 50nm can be expected using beryllium as a lens material. The large depth of field (several mm) of the microscope results in sharp projection images for samples that fit into the field of view of about 300 micrometers. This allows to combine magnified imaging with tomographic techniques. First results of magnified microtomography are shown. Contrast formation in the microscope and the consequences for tomographic reconstruction are discussed. An outlook on further developments is given.
机译:抛物线复合折射透镜(PCRL)是用于硬X射线的高质量成像光学元件,可以在新型硬X射线全视野显微镜中用作物镜。使用铝PCRL,这种新型显微镜已显示出350nm的分辨率。使用铍作为透镜材料,可以预期将分辨率进一步降低至50nm。显微镜的大景深(几毫米)可为适合约300微米视场的样品提供清晰的投影图像。这允许将放大成像与断层摄影技术相结合。显示了放大显微照片的初步结果。讨论了显微镜中的造影剂形成和层析成像重建的后果。展望了进一步的发展。

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