首页> 外文会议>Conference on Advanced Optical Manufacturing and Testing Technology 2000 1-3 November 2000 Chengdu, China >Research on Processing Technique for Interference Pattern with Step Using Phase-shift interferometry
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Research on Processing Technique for Interference Pattern with Step Using Phase-shift interferometry

机译:相移干涉法阶梯式干涉图样处理技术研究

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摘要

Based on introducing the principle and method of processing technique for interference pattern with step using the characteristic of phase-shift interferometry. The paper has discussed a new phase-unwrapping algorithm for the phase map containing discontinuities. The correct phase values in the presence of discontinuities, especially those caused by the object with height steps, can be obtaiend. This algorithm is fast and accurate. The results of the measurement of three-dimensional object with height steps are presented. These techniques have been successfully applied to measure the surface and wave aberration of the system with step.
机译:在介绍相移干涉法特性的基础上,逐步实现干涉图样处理技术的原理和方法。本文讨论了一种新的相位展开算法,用于不连续的相位图。在存在不连续性的情况下,尤其是由具有高度阶跃的物体引起的不连续性的正确相位值可以被获得。该算法快速准确。给出了三维物体高度步长的测量结果。这些技术已成功应用于逐步测量系统的表面和波像差。

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