首页> 外文会议>Conference on Advanced Materials and Devices for Sensing and Imaging, Oct 17-18, 2002, Shanghai, China >Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer
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Absolute distance measurement with a sampling type of double sinusoidal phase-modulating laser diode interferometer

机译:采样型双正弦调相激光二极管干涉仪的绝对距离测量

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We propose a new range finding technique that uses two-wavelength interferometry. The system we propose uses a single laser diode to realize a two-wavelength interferometer, which expands measurement range. The single light-source allows us to simplify the optical setup. Our devise generates two independent interference signals with respect to the wavelengths generated by offset current. The external disturbances on these interference signals are eliminated by the feedback control. Although the feedback control eliminates disturbance as well as the information about the distance, we are able to detect the distance from the phase difference between those compensated interference signals.
机译:我们提出了一种使用两波长干涉测量法的新型测距技术。我们提出的系统使用单个激光二极管来实现两波长干涉仪,从而扩大了测量范围。单个光源使我们能够简化光学设置。我们的设计针对偏移电流产生的波长产生两个独立的干扰信号。通过反馈控制可以消除这些干扰信号上的外部干扰。尽管反馈控制消除了干扰以及有关距离的信息,但我们仍能够从这些补偿干扰信号之间的相位差中检测出距离。

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