Dependency of electric field and mechanical stress on piezoelectric strain of PZT 3203HD

摘要

In this paper, material nonlinear behavior of PZT wafer(3203HD, CTS) under high electric field and tensile stress is experimentally investigated and the nonlinearity of the PZT wafer is numerically simulated. In the simulation, new definitions of the piezoelectric constant and the incremental strain are proposed. Empirical functions that can represent the nonlinear behavior of the PZT wafer have been extracted based on the measured piezo-strain under stress. The functions are implemented in an incremental finite element formulation for material nonlinear analysis. With the new definition of the incremental piezo-strain, the measured nonlinear behavior of the PZT wafer has been accurately reproduced even for high electric field.