Observation of thermal occupation of room-temperature J-aggregate microcavity exciton-polaritons

摘要

We present a measurement of the lower-branch exciton-polariton occupation in room-temperature J-aggregate microcavity devices under low-density steady-state excitation. The observed occupation follows a Maxwell-Boltzmann distribution at T=300K, indicating efficient polariton relaxation, necessary for achieving lasing.