Slow highly charged ion O4+ induced electron emission from clean solid surfaces

摘要

The total electron emission yields following the interaction of slow highly charged ions (SHCI) O4+with different material surfaces (W,Au,Si and SiO2) have been measured.It is found that the electron emission yield γ increases proportionally with the projectile velocity υ ranging from 5.36 × 105m/s to 10.7 × 105m/s.The total emission yield is dependent on the target materials,and it turns out to follow the relationship γ(Au) > γ(Si) > γ(W).The result shows that the electron emission yields are mainly determined by the electron stopping power of the target when the projectile potential energy is taken as a constant,which is in good agreement with the former studies.