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Properties of GexAs45-xSe55 Series Bulk Glasses and Amorphous Thin Films

机译:GexAs45-xSe55系列大块玻璃和非晶薄膜的性能

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oWe have evaluated GexAs45-xSe55 glass series for potential applications in infrared optics, photonics, lithography etc. The samples were characterized for density, thermal properties by differential scanning calorimeter, and Vis-NIR optical transmission spectra. With the addition of Ge, the density of bulk samples decreased,whereas the glass transition temperature (Tg) increased. Moreover, the variation of density and Tg for bulk samples showed a turning point at x~10. On the other hand,thin films showed that compositional dependence of the optical band-gap and the refractive index at fixed wavelength which decreased and increased respectively with increasing Ge content. This may be due to the formation of a significant number of homopolar Ge-Ge bonds.
机译:我们已经评估了GexAs45-xSe55玻璃系列在红外光学,光子学,光刻等方面的潜在应用。通过差示扫描量热仪和Vis-NIR光学透射光谱对样品进行了密度,热性能表征。随着Ge的加入,块状样品的密度降低,而玻璃化转变温度(Tg)升高。此外,大块样品的密度和Tg的变化在x〜10处出现拐点。另一方面,薄膜显示出随着Ge含量的增加,光学带隙的组成依赖性和固定波长下的折射率分别减小和增大。这可能是由于大量同质Ge-Ge键的形成。

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