Surface profiling of an absorber embedded in a dense medium by spatial integration of the backscattered light

摘要

Abstract: The new method to reconstruct the 2D surface profile of an absorber embedded in a dense scattering medium is proposed in the report. The method is based on the fact that the intensity of the multiply-backscattered light integrated spatially by the detecting aperture with finite size is directly related with the optical path-length distribution. Experiments and Monte Carlo simulations confirm the potential and the availability of the proposed method.!0