Effect of Applied Pressure on Patch Resonator-Based Measurements of Moisture Level for Cultural Heritage Materials

著录项

• 来源
  《Conference on Metrology for Archaeology and Cultural Heritage》|2018年|1-5|共5页
• 会议地点 Cassino(IT)
• 作者

  Livio D’Alvia; Erika Pittella; Stefano Pisa; Emanuele Piuzzi; Zaccaria Del Prete;

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• 作者单位

  University of Rome Department of Mechanical and Aerospace Engineering Sapienza Rome Italy;

  University of Rome Department of Information Engineering Electronics and Telecommunications Sapienza Rome Italy;

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• 会议组织
• 原文格式 PDF
• 正文语种
• 中图分类
• 关键词

  Resonant frequency; Frequency measurement; Moisture; Force; Q-factor; Permittivity; Moisture measurement;

  机译：共振频率频率测量;湿气;力; Q因子介电常数水分测量;