FAST NEUTRON IRRADIATION INDUCED CLUSTERS IN SILICON-SINGLE-CRYSTALS, USING X-RAY DIFFRACTION

摘要

X-ray topography is a suitable way of imaging irradiation defects and their dynamics after thermal annealing. Original Lang topographs presented are essential starting points for futher modeling of fast reactor neutron irradiation induced complex cluster structures of silicon atoms and their behaviour in different technological proccessing steps.