Screening and Qualification Testing of Chip Tantalum Capacitors for Space Applications

摘要

In this work, the existing screening and qualification system for solid chip tantalum capacitors manufactured per MIL-PRF-55365 have been analyzed, and recommendations for improvements are discussed. A new test, breakdown margin verification, is introduced, and a test flow for upscreening and quality verification of commercial tantalum capacitors for space applications is suggested.