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Effect of Surge Current Testing on Reliability of Solid Tantalum Capacitors

机译:浪涌电流测试对固态钽电容器可靠性的影响

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摘要

Tantalum capacitors manufactured per military specifications (MIL-PRF-55365) are established reliability components and have less than 0.001% of failures per 1000 hours (the failure rate is less than 10 FIT) for grades D or S, thus positioning these parts among electronic components with the highest reliability characteristics. Still, failures of tantalum capacitors do happen and when it occurs it might have catastrophic consequences for the system. This is due to a short-circuit failure mode, which might be damaging to a power supply, and also to the capability of tantalum capacitors with manganese cathodes to self-ignite. During such a failure, a substantial amount of energy is released by exothermic reaction of the tantalum pellet with oxygen generated by the overheated manganese oxide cathode, resulting not only in destruction of the part, but also in damage of the board and surrounding components.
机译:根据军事规格(MIL-PRF-55365)制造的钽电容器是公认的可靠性组件,对于D级或S级,每1000小时的故障率小于0.001%(故障率小于10 FIT),因此将这些部件放置在电子设备中具有最高可靠性特征的组件。尽管如此,钽电容器确实会发生故障,当钽电容器发生故障时,可能会对系统造成灾难性的后果。这是由于短路故障模式可能会对电源造成损害,也归因于带有锰阴极的钽电容器自燃的能力。在这种故障期间,钽丸与过热的氧化锰阴极产生的氧气发生放热反应,释放出大量能量,不仅导致零件损坏,而且还损坏了电路板和周围组件。

著录项

  • 来源
    《CARTS USA 2008》|2008年|p.293-310|共18页
  • 会议地点 Newport Beach CA(US);Newport Beach CA(US)
  • 作者

    Alexander Teverovsky;

  • 作者单位

    Perot Systems Code 562, NASA GSFC, Greenbelt, MD 20771;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 半导体技术;
  • 关键词

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