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Line Fitting Based Feature Extraction for Object Recognition

机译:基于线拟合的特征提取用于目标识别

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摘要

Image feature extraction plays a significant role in image based pattern applications. In this paper, we propose a new approach to generate hierarchical features. This new approach applies line fitting to adaptively divide regions based upon the amount of information and creates line fitting features for each subsequent region. It overcomes the feature wasting drawback of the wavelet based approach and demonstrates high performance in real applications. For gray scale images, we propose a diffusion equation approach to map information-rich pixels (pixels near edges and ridge pixels) into high values, and pixels in homogeneous regions into small values near zero that form energy map images. After the energy map images are generated, we propose a line fitting approach to divide regions recursively and create features for each region simultaneously. This new feature extraction approach is similar to wavelet based hierarchical feature extraction in which high layer features represent global characteristics and low layer features represent local characteristics. However, the new approach uses line fitting to adaptively focus on information-rich regions so that we avoid the feature waste problems of the wavelet approach in homogeneous regions. Finally, the experiments for handwriting word recognition show that the new method provides higher performance than the regular handwriting word recognition approach.
机译:图像特征提取在基于图像的图案应用中起着重要作用。在本文中,我们提出了一种生成分层特征的新方法。这种新方法将线拟合应用于基于信息量的自适应划分区域,并为每个后续区域创建线拟合特征。它克服了基于小波的方法浪费特征的缺点,并在实际应用中展示了高性能。对于灰度图像,我们提出了一种扩散方程方法,可将信息丰富的像素(靠近边缘和山脊像素的像素)映射为较高的值,并将均匀区域中的像素映射为接近零的较小的值,从而形成能量映射图像。生成能量图图像后,我们提出了一种线拟合方法来递归划分区域并同时为每个区域创建特征。这种新的特征提取方法类似于基于小波的分层特征提取,其中高层特征代表全局特征,而低层特征代表局部特征。然而,新方法使用线拟合来自适应地关注信息丰富的区域,从而避免了均质区域中小波方法的特征浪费问题。最后,手写单词识别实验表明,该新方法比常规的手写单词识别方法具有更高的性能。

著录项

  • 来源
    《Automatic target recognition XXIV》|2014年|90900K.1-90900K.9|共9页
  • 会议地点 Baltimore MD(US)
  • 作者

    Bing C. Li;

  • 作者单位

    Lockheed Martin MST-Owego 1801 State Route 17C, 0315 Owego, NY 13827-3998;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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