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Parametric study of the validity of the weak-line and strong-line limits of infrared H2O band absorption

机译:H2O红外吸收带弱线和强线限值有效性的参数研究

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Abstract: The goal of this research was to map the regimes of validity of the weak-line and strong-line limits as a function of temperature, pressure, and path length for the 2.7 $mu@m and 6.3 $mu@m H$-2$/O absorption bands. These calculations were done using an updated version of the NASA band model. A parametric study was performed where the error in assuming the validity of the two limits was calculated as a function of the physical parameters temperature, pressure, and path length. Results were generated in the form of spectral plots of the error and as band- integrated error presented in contour plots as a function of temperature and path length. Results indicate that for both bands, the weak-line error is localized in regions of intermediate temperatures and pressures at all path lengths. The strong-line limit error shows a linear increasing trend with pressure at short path lengths, while varying as a saddle-shaped function with respect to temperature and pressure at longer path lengths. !11
机译:摘要:这项研究的目的是绘制2.7 $ mu @ m和6.3 $ mu @ m H $的弱线和强线限值的有效性随温度,压力和路径长度的变化情况-2 $ / O吸收带。这些计算是使用NASA波段模型的更新版本进行的。进行了参数研究,根据物理参数温度,压力和路径长度计算了假设两个极限值的有效性时的误差。结果以误差的频谱图的形式生成,并以等高线图中的带积分误差形式随温度和路径长度变化而产生。结果表明,对于这两个频带,弱线误差均位于所有路径长度上的中间温度和压力区域。强线极限误差在短路径长度下随压力呈线性增加趋势,而在较长路径长度下随温度和压力呈鞍形函数变化。 !11

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