Limitations of near-field proble position error correction techniques

摘要

a comparison of three near-field position error correction technques has been performed on simulated near-field data. The purpose of this study was to evaluate the allowable positional tolerances required for planar near-field scanners. Simple k-correction, extended k-correction, and Taylor-series correction were applied to computed near-field data contaiminated with various kinds of errors. including position errors in one and three dimesions, and random electrical nosie. Ideal and eorro contaimated near-field data were computed for samll-size, mid-size, and large-skze arrays. Proble position errors up to one-quartier wavelegth in each axis and one wavelenth in a single axis were used. Probe position error correction was performed using all three medhos, and the results were evaluated.