MEASUREMENT OF WIDEBAND ARRAYS

摘要

Determination of Scan Element Pattern (SEP) and of Scan Impedance (SI) of wideband arrays is desirable, in addition to patterns and gain. Scan Element Pattern gives array gain versus scan angles and frequency, while Scan Impedance is the impedance versus scan angle and frequency that must be matched. Some organizations have been measuring SEP in transmit mode, with all elements terminated and the center element driven. This procedure gives erroneous results, as the mutual couplings are all passive. The way of properly measuring SEP is to place the array in a gain measurement setup as a receive antenna, so that all elements are terminated and properly excited. The nominal center element is connected to the receiver; the Scan Impedance mismatch is included in SEP. Knowledge of Scan Impedance is important, as it controls the impedance matching possibilities. It is however difficult to measure. Network analyzers (HP8510) measure impedance both (S_(11) and S_(22)) by transmitting a signal and measuring the reflected signal, thus do not allow operation in a mode with all elements excited. A full feed network can be employed, with the network modified to allow measurement of the current and voltage at the center element. This method is seldom used. Because of the importance of SI, use is often made of waveguide simulators, and simulation codes. The infinite array Floquet unit cell codes must be used with caution as these codes omit edge effects; these may be very important in some types of coupled arrays. A planar array code is used to simulate both transmit (single element excited) SEP, and receive SEP. Data on SEP and SI are presented.