Trace element analysis of precious metals in minerals by time-of-flight resonance ionization mass spectrometry (tof-rims)

摘要

Detection and quantification of precious metals (Au, Pd, Pt, and Rh) in spinels and silicate minerals is important for establishig the maximum attainable recovery by sulphide flotation. To achieve this goal subpart per billion (ppb) detection limits are required plus the ability to quantify results. Existing quantitative microbeam techniques (EPMA, PIXE, SIMS, TOFLIMS) have limits of detection in the 0.1-200ppm range. Time-of-flight resonance ionization mass spectrometry (TOF-RIMS) is a microbeam analytical technique that allows for the identification and quantification of atomic species in very small quantities. it utilizes a tunable laser source for resonant excitation and ionization of a particular element of interest and has some unique features: elemental selectivity, linear response over a large dynamic range and very high sensitivity. The analysis consist of three steps: (i) the solid sample is vaporized by laser ablation to form a plume containing neutral atoms, (ii) the neutral atoms of a specific atomic element in the plume are resonantly excited and ionized by another tunable laser, and finally (iii) the ions created are mass analyzed in a time-of-flight mass spectrometer. A TOF-RIMS mass spectrometer was developed at AMTEL for trace element analysis of Au, Pd, and Rh in minerals. The spectrometer was calibrated using homogeneous CANMET and NIST reference samples covering three orders of magnitude in concentration. Attained minimum detection limits (MDL-2#signma# of the background) are in the low ppb range.