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DESIGN AND ANALYSIS OF A NANO-STEPPING DEVICE

机译:纳米加工装置的设计与分析

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摘要

For low cost and ease of use displacement measurement and calibration at the resolution of nanometer level, a new nano-stepping device design for nanometer displacement measurement and calibration is proposed. The design is based on the F-P cavity and the multi-beam interference principle. The analysis shows the device is to have a resolution of 0.2nm and a range better than 100μm. The device is compact in size. From the Abbe principle and the shortest link rule, it should be stable and immune to environmental disturbances.
机译:为了低成本和易于使用,在纳米级分辨率下进行位移测量和校准,提出了一种用于纳米位移测量和校准的新型纳米步进装置设计。该设计基于F-P腔和多光束干涉原理。分析表明该设备的分辨率为0.2nm,范围优于100μm。该装置尺寸紧凑。从阿贝原理和最短联系规则来看,它应该稳定并且不受环境干扰。

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