首页> 外国专利> INTER-DESIGN DESCRIPTION DIFFERENCE ANALYSIS DEVICE, INTER-DESIGN DESCRIPTION DIFFERENCE ANALYSIS PROGRAM AND INTER-DESIGN DESCRIPTION DIFFERENCE ANALYSIS METHOD

INTER-DESIGN DESCRIPTION DIFFERENCE ANALYSIS DEVICE, INTER-DESIGN DESCRIPTION DIFFERENCE ANALYSIS PROGRAM AND INTER-DESIGN DESCRIPTION DIFFERENCE ANALYSIS METHOD

机译:帧间描述差异分析装置,帧间描述差异分析程序和帧间描述差异分析方法

摘要

PROBLEM TO BE SOLVED: To provide an inter-design description difference analysis device, an inter-design description difference analysis program and an inter-design description difference analysis method capable of analyzing the minimum difference between a first instruction string and a second instruction string.;SOLUTION: In an inter-design description difference analysis device 1, under a constraint (constraint of instruction coincidence) that when names Np, Nq are coincident, and operands Op, Oq in an instruction are coincident, the instructions p, q are coincident, a constraint (constraint of uniqueness guarantee of coincidence) that one instruction p of an intermediate instruction string is coincident with one instruction q of a post-ECO intermediate instruction string and a constraint (constraint of sequence violation) that the instruction q of the post-ECO intermediate instruction string complies with the sequence of the instruction p of the intermediate instruction string, a correspondence relationship between the instructions p, q is specified such that the number of instruction sets in which internal expressions are coincident among the combination of the instructions p, q becomes the maximum. The correspondence relationship specified by applying the above mentioned method is applied to a normalized instruction string 14a and a post-ECO normalized instruction string 14b such that the minimum difference between an intermediate instruction string 15a and a post-ECO intermediate instruction string 15b can be analyzed.;COPYRIGHT: (C)2014,JPO&INPIT
机译:解决的问题:提供一种设计间描述差异分析装置,设计间描述差异分析程序和设计间描述差异分析方法,其能够分析第一指令串和第二指令串之间的最小差异。 ;解决方案:在设计间描述差异分析设备1中,在名称N p ,N q 一致且操作数受约束的情况下(指令一致)一条指令中的O p ,O q 是重合的,指令p,q是重合的,是中间一条指令p的约束(重合唯一性约束)指令串与后ECO中间指令串的一条指令q和一个约束(序列冲突的约束)一致,该约束(ECO后中间指令串的指令q符合指令p的序列)在中间指令串的“ 0”中,指定指令p,q之间的对应关系,使得在指令p,q的组合中内部表达式一致的指令集的数量变为最大。将通过应用上述方法指定的对应关系应用于归一化指令串14a和ECO后归一化指令串14b,使得可以分析中间指令串15a和ECO后中间指令串15b之间的最小差。 。;版权:(C)2014,JPO&INPIT

著录项

  • 公开/公告号JP2014041571A

    专利类型

  • 公开/公告日2014-03-06

    原文格式PDF

  • 申请/专利权人 UNIV OF TOKYO;

    申请/专利号JP20120184662

  • 发明设计人 YOSHIDA HIROAKI;FUJITA MASAHIRO;

    申请日2012-08-23

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 16:15:41

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