【24h】

Is there a critical size in nano grained metals for ductile to brittle transition?

机译:纳米颗粒金属是否具有从韧性到脆性转变的临界尺寸?

获取原文
获取原文并翻译 | 示例
获取外文期刊封面目录资料

摘要

Nanoscale metal films and electrodes are extensively used in today's micro and nano electronics as well as nano mechanical systems. These metal structures are usually polycrystalline in nature with nano scale grains connected to each other by grain boundaries. The small size offers large grain boundary to volume ratio that is likely to affect the metal properties significantly. Here, we discuss the role of grain size and boundaries in determining the mechanical behavior of metals, such as elasticity and yielding. We first develop a novel micro apparatus that allows uniaxial tensile testing of free standing nano scale metal specimens as thin as 30nm. There are two unique features of the apparatus: (1) The specimen and the sensors to measure forces and displacements are co-fabricated - a paradigm shift in materials testing. Co-fabrication avoids the problem of handling the small sample, and suppresses any misalignment errors by five orders of magnitude, and (2) Testing can be carried out in-situ in SEM (Scanning Electron Microscope) or TEM (Transmission Electron Microscope). The latter allows visualization of the micro structure at sub-nanometer resolution while the stress-strain response is measured. Thus, the evolution of microstructure can be correlated with the stress-strain response to reveal the mechanism of deformation at nano scale. Figure 1 shows the apparatus with an aluminum sample, 100nm thick, 10 μm wide and 250 μm long.
机译:纳米级金属膜和电极广泛用于当今的微米和纳米电子产品以及纳米机械系统中。这些金属结构通常本质上是多晶的,纳米级晶粒通过晶界相互连接。小尺寸提供大的晶界体积比,这可能会显着影响金属性能。在这里,我们讨论晶粒尺寸和边界在确定金属的机械行为(例如弹性和屈服)中的作用。我们首先开发了一种新型的微型仪器,该仪器可以对30纳米薄的独立式纳米金属样品进行单轴拉伸测试。该设备具有两个独特的功能:(1)样品和用于测量力和位移的传感器是共同制造的-材料测试中的范式转变。共同制造避免了处理小样品的问题,并且将任何未对准误差抑制了五个数量级,并且(2)可以在SEM(扫描电子显微镜)或TEM(透射电子显微镜)中进行原位测试。后者允许在测量应力应变响应的同时以亚纳米分辨率可视化微观结构。因此,微观结构的演变可以与应力-应变响应相关联,以揭示纳米级变形的机理。图1显示了带有铝样品的设备,铝样品的厚度为100nm,宽为10μm,长为250μm。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号