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SCANNING PROBE MICROSCOPE 3D IMAGES ANALYSIS OF THE GLASS CERAMIC SUBSTRATE SURFACE

机译：玻璃陶瓷基体表面的扫描探针显微镜3D图像分析

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In this paper the results of the surface topology study of a glass ceramic CT-50-1 substrate after the effect of CO_2-laser radiation are presented. Three-dimensional images using a scanning probe microscope Solver P47 Pro in a tapping mode of the atomic-force microscopy are obtained. The analysis of the images obtained has been carried out.

机译：本文介绍了玻璃陶瓷CT-50-1衬底在CO_2激光辐射作用后的表面拓扑研究结果。使用扫描探针显微镜Solver P47 Pro在原子力显微镜的敲击模式下获得三维图像。已经对获得的图像进行了分析。

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《Advances in coordinate metrology》|2010年|p.471-476|共6页
会议地点 Bielsko-Biala(PL)
作者
Valery V. BESOGONOV; Irina N. SKVORTSOVA; Nikola Abo ISSA;
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作者单位

The Institute of Applied Mechanics of the Ural Branch of the Russian Academy of Sciences, 34, T.Baramzinoy str., Izhevsk, 426067, Russia;

The Institute of Applied Mechanics of the Ural Branch of the Russian Academy of Sciences, 34, T.Baramzinoy str., Izhevsk, 426067, Russia;

The Institute of Applied Mechanics of the Ural Branch of the Russian Academy of Sciences, 34, T.Baramzinoy str., Izhevsk, 426067, Russia,Damascus University, 86 Damascus Syria;

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原文格式 PDF
正文语种 eng
中图分类计量学;
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1. Formation of binary and ternary metal deposits on glass-ceramic carbon electrode surfaces: electron-probe X-ray microanalysis, total-reflection X-ray fluorescence analysis, X-ray photoelectron spectroscopy and scanning electron microscopy study [J] . Nikolai V.Alov, Kirill V.Oskolok Spectrochimica Acta, Part B. Atomic Spectroscopy . 2003,第4期

机译：在玻璃陶瓷碳电极表面上形成二元和三元金属沉积物：电子探针X射线显微分析，全反射X射线荧光分析，X射线光电子能谱和扫描电子显微镜研究
2. Study of the thermal stability of Zerodur glass ceramics suitable for a scanning probe microscope frame [J] . Ondrej Cip, Radek Smid, Martin Cizek, Central European Journal of Physics . 2012,第2期

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4. SCANNING PROBE MICROSCOPE 3D IMAGES ANALYSIS OF THE GLASS CERAMIC SUBSTRATE SURFACE [C] . Valery V. BESOGONOV, Irina N. SKVORTSOVA, Nikola Abo ISSA International Science Conference Coordinate Measuring Technique . 2010

机译：扫描探针显微镜3D图像分析玻璃陶瓷基板表面
5. Low Temperature Scanning Probe Microscope for Imaging Nanometer Scale Electronic Devices. [D] . Trodahl, Halvar Joseph. 2011

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SCANNING PROBE MICROSCOPE 3D IMAGES ANALYSIS OF THE GLASS CERAMIC SUBSTRATE SURFACE

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