DRS Network Imaging Systems, LLC, 13544 N. Central Expressway, Dallas, Texas, 75243;
DRS Network Imaging Systems, LLC, 13544 N. Central Expressway, Dallas, Texas, 75243;
DRS Network Imaging Systems, LLC, 13544 N. Central Expressway, Dallas, Texas, 75243;
DRS Network Imaging Systems, LLC, 13544 N. Central Expressway, Dallas, Texas, 75243;
DRS Network Imaging Systems, LLC, 13544 N. Central Expressway, Dallas, Texas, 75243;
NASA Goddard Space Flight Center, Greenbelt, Maryland 20771;
NASA Goddard Space Flight Center, Greenbelt, Maryland 20771;
A/DIC Inc., 740 Florida Central Parkway, Longwood, FL 32750;
A/DIC Inc., 740 Florida Central Parkway, Longwood, FL 32750;
single photon counting; avalanche photodiode; HgCdTe; APD; MWIR; excess noise factor; photon detection efficiency; false event rate;
机译:使用HgCdTe线性模式雪崩光电二极管更新线性模式光子计数
机译:用于光子计数应用的线性模式HgCdTe雪崩光电二极管
机译:线性模式HgCdTe雪崩光电二极管nfor光子计数应用
机译:用HGCDTE Avalanche光电二极管焦平面阵列从可见的线性模式光子计数从可见的MWIR
机译:太阳盲紫外光电探测器,焦平面阵列和可见盲雪崩光电二极管。
机译:HgCdTe光电二极管中使用双光子吸收电调制效应的光学限制
机译:单光子计数雪崩光电二极管焦平面阵列的封装和鉴定