United Silicon Carbide, Inc, 100 Jersey Ave., New Brunswick, NJ 08901, USA;
SiCLAB, Dept. of ECE, Rutgers University, 94 Brett Road, Piscataway, NJ 08854, USA;
Naval Research Laboratory, Code 6882, 4555 Overlook Ave SW, Washington, DC 20375, USA;
single photon counting; SPAD; avalanche; dark count; detection efficiency; quantum efficiency; solar blind;
机译:以盖革模式工作的日盲4H-SiC单光子雪崩二极管
机译:用于280和350 nm紫外检测的4H-SiC可见盲单光子雪崩二极管
机译:太阳能单光子4H-SiC雪崩光电二极管
机译:高性能4H-SIC单光子雪崩二极管在太阳盲波长下工作
机译:CMOS单光子雪崩二极管和微机械滤光片,用于集成荧光传感。
机译:高性能平面硅上锗单光子雪崩二极管探测器
机译:采用负反馈雪崩二极管的超低噪声电信波长自由运行单光子探测器