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Plasma Processing of III-V Materials for Energy Efficient Electronics Applications

机译:用于节能电子应用的III-V材料的等离子处理

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摘要

This paper reviews some recent activity at the James Watt Nanofabrication Centre in the University of Glasgow in the area of plasma processing for energy efficient compound semiconductor-based transistors. Atomic layer etching suitable for controllable recess etching in GaN power transistors will be discussed. In addition, plasma based surface passivation techniques will be reviewed for a variety of compound semiconductor materials ((100) and (110) oriented InGaAs and InGaSb).
机译:本文回顾了格拉斯哥大学James Watt纳米制造中心的最新活动,该活动在基于能量的基于化合物半导体的晶体管的等离子体处理领域。将讨论适用于GaN功率晶体管中可控凹槽蚀刻的原子层蚀刻。另外,将对各种化合物半导体材料((100)和(110)取向的InGaAs和InGaSb)的基于等离子体的表面钝化技术进行综述。

著录项

  • 来源
    《Advanced etch technology for nanopatterning VI》|2017年|101490R.1-101490R.9|共9页
  • 会议地点 San Jose(US)
  • 作者单位

    James Watt Nanofabrication Centre, School of Engineering, University of Glasgow, Glasgow G12 8QQ, Scotland, UK;

    James Watt Nanofabrication Centre, School of Engineering, University of Glasgow, Glasgow G12 8QQ, Scotland, UK;

    James Watt Nanofabrication Centre, School of Engineering, University of Glasgow, Glasgow G12 8QQ, Scotland, UK;

    James Watt Nanofabrication Centre, School of Engineering, University of Glasgow, Glasgow G12 8QQ, Scotland, UK;

    James Watt Nanofabrication Centre, School of Engineering, University of Glasgow, Glasgow G12 8QQ, Scotland, UK;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Compound semiconductors; atomic layer etching; plasma-based surface passivation;

    机译:复合半导体;原子层蚀刻基于等离子体的表面钝化;
  • 入库时间 2022-08-26 14:30:33

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