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On the Properties of Divacancies in Si_(1-x)Ge_x

机译:关于Si_(1-x)Ge_x中的奇异性质

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It has been shown that during the irradiation the V——2 and V_2Ge centers are formed and a 5560 cm~(-1) absorption band in as-irradiated Si_(1-x)Ge_x samples is the superposition of two bands corresponding to the absorption by the V_2~0 and V_2Ge centers. With the increase of germanium content the contribution of V_2Ge centers to the absorption band increases and at Ge concentration about 15 at.% absorption band corresponding to V_2~0 practically disappears. A thermostability of the V_2Ge centers is shown to be essentially higher than the one of the divacancy in silicon and increases with germanium content.
机译:结果表明,在辐照过程中,形成了V——2和V_2Ge中心,被辐照的Si_(1-x)Ge_x样品中的5560 cm〜(-1)吸收带是与能带对应的两个能带的叠加。被V_2〜0和V_2Ge中心吸收。随着锗含量的增加,V_2Ge中心对吸收带的贡献增加,并且在Ge浓度下,对应于V_2〜0的约15at。%的吸收带实际上消失了。 V_2Ge中心的热稳定性显示出实质上高于硅中的空位之一,并且随锗含量的增加而增加。

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