首页> 外文会议>29th annual national conference of the American Society for Engineeering Management 2008 >Reliability Life Test Method Impacting on New Electronic Product Introduction Process
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Reliability Life Test Method Impacting on New Electronic Product Introduction Process

机译:可靠性寿命测试方法对新电子产品引入过程的影响

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摘要

Universal Lighting Technologies (ULT) needed to choose the reliability test method in the new electronic product development process. It would make the new design with a short mature time and high reliability and quality. And it would make ULT have high competitive ability in today market. In the trade study, four reliability test methods (Highly Accelerated Life Test (HALT), Accelerated Life Test (ALT), Thermal Aging Test (TAT) and Environmental Life Test (ELT)) were selected to do analysis and evaluation. The combination of ALT and HALT was selected to have the best probability of success to meet the numerous requirements of new product development. The result of this project would be presented at ULT and get the approval of the reliability test method used in the new product design phase.
机译:通用照明技术(ULT)需要在新的电子产品开发过程中选择可靠性测试方法。这将使新设计的成熟时间短,可靠性和质量高。它将使ULT在当今市场上具有较高的竞争能力。在行业研究中,选择了四种可靠性测试方法(高加速寿命测试(HALT),加速寿命测试(ALT),热老化测试(TAT)和环境寿命测试(ELT))进行分析和评估。选择ALT和HALT的组合具有最大的成功概率,可以满足新产品开发的众多要求。该项目的结果将在ULT上展示,并获得新产品设计阶段使用的可靠性测试方法的批准。

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