首页> 外文会议>26th International Conference on the Physics of Semiconductors Jul 29-Aug 2, 2002 Edinburgh, UK >Picosecond Infrared Transient Grating and VibrationalEcho Spectroscopy of Deuterated Amorphous SiliconThin Films
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Picosecond Infrared Transient Grating and VibrationalEcho Spectroscopy of Deuterated Amorphous SiliconThin Films

机译:氘化非晶硅薄膜的皮秒红外瞬变光栅和振动回波光谱。

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摘要

Utilising the infrared output of a free electron laser (FEL), wernhave made transient grating measurements of the temperature dependentrnanharmonic decay rate of Si-D stretch vibrations in deuterated amorphousrnsilicon. Unlike Si-H vibrations, it is found that the excited deuteriumrnmode relaxed with a single exponential decay rate into collective modes ofrnthe host, bypassing the local bending modes. Vibrational echornmeasurements suggest that phase coherence is lost via elastic phononrnscattering with excitation (but not temperature) dependent contributionsrnfrom non-equilibrium phonons.
机译:利用自由电子激光器(FEL)的红外输出,我们对氘化非晶硅中Si-D拉伸振动的温度相关纳谐衰减速率进行了瞬态光栅测量。与Si-H振动不同,发现激发的氘模以单指数衰减率弛豫成主体的集体模,绕过了局部弯曲模。振动回波测量表明,通过非平衡声子的激发(但不是温度)依赖性贡献的弹性声子散射会丢失相位相干性。

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