首页> 外文会议>26th International Conference on the Physics of Semiconductors Jul 29-Aug 2, 2002 Edinburgh, UK >Finely controlling quantum dots on GaAs surface patterned by removing oxide dots formed in atomic-force microscope lithography
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Finely controlling quantum dots on GaAs surface patterned by removing oxide dots formed in atomic-force microscope lithography

机译:通过去除原子力显微镜光刻中形成的氧化物点,精细控制GaAs表面上形成的量子点

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摘要

On a GaAs surface, atomic force microscope lithography isrnused to fabricate nanometer oxide dots. When the oxide dots are suitablyrndetached from the substrate, holes of the same size are formed. Byrnovergrowing InGaAs on such a hole-patterned surface, one singlernquantum dot, whose size depends on the hole and can be as small as 20rnnm in diameter, is formed on the site of each hole. This technique isrnuseful to construct quantum dot arrays as solid-state qubit structures forrnquantum computing since differently sized quantum dots can bernsimultaneously fabricated.
机译:在GaAs表面上,用原子力显微镜光刻法制造纳米氧化物点。当氧化物点从衬底适当地剥离时,形成相同尺寸的孔。通过在这样的具有孔图案的表面上过度生长InGaAs,在每个孔的位置上形成一个单个量子点,该单个量子点的大小取决于该孔,并且直径可以小至20nmnm。由于可以同时制造不同尺寸的量子点,因此该技术对于将量子点阵列构造为用于量子计算的固态量子位结构是无用的。

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  • 来源
  • 会议地点 Edinburgh(GB);Edinburgh(GB)
  • 作者单位

    Fujitsu Laboratory Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan;

    rnFujitsu Laboratory Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan;

    rnInstitute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan;

    rnInstitute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan;

    rnFujitsu Laboratory Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan;

    rnInstitute of Applied Physics, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan;

    rnFujitsu Laboratory Ltd., 10-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0197, Japan;

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  • 正文语种 eng
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