首页> 外文会议>21st International Conference on Defects in Semiconductors (ICDS-21) Jul 16-20, 2001 Giessen, Germany >Temperature dependences of line widths and peak positions of optical absorption peaks due to localized vibration of hydrogen Si
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Temperature dependences of line widths and peak positions of optical absorption peaks due to localized vibration of hydrogen Si

机译:氢硅的局部振动引起的线宽和光吸收峰的峰位置的温度依赖性

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We studied the temperature dependences of line widths and peak positions of optical absorptions due to the hydrogen bound to point defects and acceptors in Si. Specimens were prepared from floating-zone-grown Si crystals of high-purity and of p-type, doped with group III acceptors. They were doped with H by heating at 1300℃ in H_2 gas followed by quenching. The former specimen was then irradiated with 3 MeV electrons at RT to form complexes of H and point defects and the latter specimens were annealed at 150℃ to form H―acceptor pairs. We measured their optical absorption spectra by an FT-IR spectrometer in the temperature range of 6K and RT. Peaks due to localized vibrational modes of H bound to acceptors and point defects were well fitted with Lorentzian line shapes. The temperature dependences of those line widths and peak positions were analyzed with the dephasing model proposed by Persson and Ryberg.
机译:我们研究了线宽和光吸收峰位置的温度依赖性,这是由于氢键合到Si中的点缺陷和受体引起的。从高纯度和p型浮区生长的Si晶体制备样品,并掺入III类受体。通过在1300℃的H_2气体中加热然后淬火,将它们掺杂有H。然后,前者在室温下用3 MeV电子辐照形成H和点缺陷的络合物,后者在150℃退火形成H-受体对。我们通过FT-IR光谱仪在6K和RT的温度范围内测量了它们的光吸收光谱。由于H结合到受体和点缺陷的局部振动模式而产生的峰与Lorentzian线形完全吻合。使用Persson和Ryberg提出的移相模型分析了这些线宽和峰位置的温度依赖性。

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