Reliability-Aware Multi-Vth Domain Digital Design Assessment

摘要

Resilient systems for future application as the Internet of Things (IoT), aerospace or automotive must satisfy demanding specifications over a 10-years lifespan. Thus, time-dependent degradation must be considered in early design stages. To ensure a realistic estimation of degradation impact a whole matrix decomposition algorithm is implemented in a 65nm CMOS technology with different multi threshold voltage standard cells, for a required low-power design. We present an assessment method based on stochastic mission profiles saving at least 10% area and power compared to common methods.