首页> 外文会议>20th International Symposium on Effects of Radiation on Materials, Jun 6-8, 2000, Williamsburg, Virginia >Effects of Neutron Irradiation and Thermal Annealing on Model Alloys Using Positron Annihilation Techniques
【24h】

Effects of Neutron Irradiation and Thermal Annealing on Model Alloys Using Positron Annihilation Techniques

机译:正电子ni没技术对中子辐照和热退火对模型合金的影响

获取原文
获取原文并翻译 | 示例

摘要

We present the results of a systematic investigation of neutron-irradiated and thermally annealed Fe-Cu-Ni-P model alloys using positron annihilation spectroscopy (PAS), including lifetime and Doppler broadening techniques, and Rockwell hardness. These alloys were examined in the as-fabricated state, after irradiation at 270℃ to 1 X 10~(19) n.cm~(-2), and to 8 X 10~(19) n.cm~(-2), and after successive post-irradiation isochronal anneals at temperatures from 200 to 600℃. The results can be qualitatively explained by invoking an irradiation-induced microstructure consisting of a combination of small dislocation-type defects or defect clusters (matrix damage) and dense precipitation of fine scale irradiation-induced precipitates. The matrix damage anneals between 350℃ and 450℃. The irradiation-induced precipitates also evolve with annealing, but at higher temperatures. The combined effect of high Cu and high Ni concentrations leads to more extensive irradiation-induced precipitation than in cases where either element is missing, whereas the effect of P is less pronounced. We analyze and compare the results with similar measurements performed on irradiated pressure-vessel steels and with other positron measurements on model alloys, reported in the literature.
机译:我们介绍了使用正电子an没光谱法(PAS)对中子辐照和热退火的Fe-Cu-Ni-P模型合金进行系统研究的结果,包括寿命和多普勒展宽技术以及洛氏硬度。在270℃下辐照1 X 10〜(19)n.cm〜(-2)和8 X 10〜(19)n.cm〜(-2)后,对这些合金进行加工。 ,并在200至600℃的温度下进行连续的辐照后等时退火。可以通过调用由辐射引起的微观结构(由小的位错型缺陷或缺陷簇(矩阵损伤)与小规模辐照引起的沉淀物的密集沉淀相结合)来定性地解释结果。在350℃至450℃之间进行基体损伤退火。辐射诱导的沉淀物也会随着退火而析出,但温度更高。与缺少任何一种元素的情况相比,高浓度的铜和高浓度的镍共同作用会导致更广泛的辐射诱导沉淀,而磷的影响则不那么明显。我们对结果进行了分析,并与文献报道的在辐照压力容器钢上进行的类似测量以及在模型合金上进行的其他正电子测量进行了比较。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号