PROBE CORRECTION EFFECTS ON PLANAR, CYLINDRICAL AND SPHERICAL NEAR-FIELD MEASUREMENTS

摘要

The accuracy of the probe antenna pattern used for probe-corrected near-field measurements is critical for maintaining high accuracy results. The probe correction is applied differently in the three standard near-field techniques - planar, cylindrical, and spherical. This paper will review the differences in sensitivity to probe correction for the three techniques and discuss practical aspects of probe correction models and measurements.