首页> 外文会议>2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility >Analysis of the accuracy and limitation of contour integral equation modeling of planar structures
【24h】

Analysis of the accuracy and limitation of contour integral equation modeling of planar structures

机译:平面结构轮廓积分方程建模的精度和局限性分析

获取原文
获取原文并翻译 | 示例

摘要

This paper presents the derivation of contour integral equation (CIE) modeling of planar structures based on field quantities and equivalence principle. It is shown that the CIE derived based on field quantities is essentially the same as the one derived based on voltages and currents. The derivation of CIE based on field quantities provides better understanding of the assumption of CIE, and thus allows easy analysis of the accuracy and limitation of CIE. Simulations are performed to evaluate the validity of the assumptions, and the accuracy of CIE is investigated.
机译:本文提出了基于场量和等价原理的平面结构轮廓积分方程(CIE)建模的推导。结果表明,基于场量得出的CIE与基于电压和电流得出的CIE基本相同。基于场量的CIE推导可以更好地理解CIE的假设,因此可以轻松分析CIE的准确性和局限性。进行仿真以评估假设的有效性,并研究CIE的准确性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号