Testable Design and Test of Integrated Systems (TDT) Group, CTIT, University of Twente, Enschede, the Netherlands;
Testable Design and Test of Integrated Systems (TDT) Group, CTIT, University of Twente, Enschede, the Netherlands;
Testable Design and Test of Integrated Systems (TDT) Group, CTIT, University of Twente, Enschede, the Netherlands;
Testable Design and Test of Integrated Systems (TDT) Group, CTIT, University of Twente, Enschede, the Netherlands;
Instruments; Monitoring; Temperature measurement; Temperature sensors; Plasma temperature; Aging; Timing;
机译:容错汽车嵌入式系统的安全性和可靠性方面的发展
机译:适用于可靠嵌入式系统的软件基础架构
机译:实时嵌入式系统的建模可靠性功能
机译:一种用于高可靠性的高级嵌入式仪器基础设施的汽车MP-SEC
机译:片上网络:用于MP-SoC平台的新兴互连基础结构。
机译:高级计量基础设施入侵检测系统:基于跨层特征融合CNN-LSTM的方法
机译:可靠的嵌入式无线基础架构