Institute for Materials Research, Tohoku University, Sendai, Japan;
Samsung RD Institute Japan, Yokohama, Japan;
Institute for Materials Research, Tohoku University, Sendai, Japan;
Department of Electronic Engineering, College of Science and Technology, Nihon University, Funabashi, Japan;
Samsung RD Institute Japan, Yokohama, Japan;
Institute for Materials Research, Tohoku University, Sendai, Japan;
Perpendicular magnetic anisotropy; Metals; Magnetometers; Annealing; Saturation magnetization; Films;
机译:Co_2Fe_(0.4)Mn_(0.6)Si Heuslar合金超薄膜的下层依赖性垂直磁各向异性
机译:Co 2 sub> Fe
机译:具有高B2排序的多晶CO2FE0.4MN0.6SI HEUSLER合金薄膜,磁隧道结基传感器具有高B2排序和小磁各向异性
机译:Co2Fe0.4mn0.6si Heusler合金超薄膜的底层依赖性垂直磁各向异性
机译:磁各向异性的应变工程:III-V族半导体上钴-锰-镓赫斯勒合金膜的外延生长
机译:Heusler合金膜及其磁阻结的垂直磁各向异性
机译:具有垂直磁各向异性的Heusler合金膜的低温结晶