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Corporate-feed slotted wavguide array antenna at 350 GHz band by silicon process

机译:通过硅工艺在350 GHz频段的公司馈送缝隙波导阵列天线

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A corporate feed slotted waveguide array antenna with broadband characteristics in term of gain in the 350 GHz band is achieved by measurement for the first time. The etching accuracy for thin laminated plates of the diffusion bonding process with conventional chemical etching is limited to ±20μm. This limits the use of this process for antenna fabrication in the submillimeter wave band where the fabrication tolerances are very severe. To improve the etching accuracy of the thin laminated plates, a new fabrication process has been developed. Each silicon wafer is etched by DRIE (deep reactive ion etcher) and is plated by gold on the surface. This new fabrication process provides better fabrication tolerances about ±5μ™ using wafer bond aligner. The thin laminated wafers are then bonded with the diffusion bonding process under high temperature and high pressure. To validate the proposed antenna concepts, four antenna prototypes have been designed and fabricated in the 350 GHz band. The 3dB-down gain bandwidth is about 35GHz by this silicon process while it was about 15GHz by the conventional process using metal plates in measurement.
机译:首次通过测量获得了在350 GHz频带内具有宽带特性的企业馈送缝隙波导阵列天线。使用常规化学蚀刻的扩散结合工艺的薄层压板的蚀刻精度限制为±20μm。这限制了该工艺在亚毫米波段的天线制造中的使用,在亚毫米波段中制造公差非常严格。为了提高薄层压板的蚀刻精度,已经开发了新的制造工艺。每个硅晶片都通过DRIE(深反应离子刻蚀机)蚀刻,并在表面镀金。使用晶圆键合对准器,这种新的制造工艺可提供约±5μ™的更好制造公差。然后,在高温和高压下通过扩散结合工艺将薄的层压晶片结合在一起。为了验证所提出的天线概念,已经在350 GHz频段设计并制造了四个天线原型。通过这种硅工艺,降低3dB的增益带宽约为35GHz,而采用金属板进行测量的常规工艺则约为15GHz。

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