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Single event effect vulnerability analysis and on-orbit error rate prediction

机译:单事件效应漏洞分析和在轨错误率预测

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摘要

On-orbit single event effect error rate is predicted combining accelerated radiation test and space radiation environment model for a FPGA-based signal processing platform. With partial TMR and reconfiguration mitigation method, there is no single event latch is observed when the surface linear energy transfer of heavy ion is 99.8 MeV.cm2/mg, and the error/SEU ratio is 4.7431e-004. Error rate of four different orbits (400 km, 800 km, 1200 km, 35784 km) is calculated, the most vulnerability orbit is the 1200 km orbit, and the average first error time is 521.8 days.
机译:针对基于FPGA的信号处理平台,结合加速辐射测试和空间辐射环境模型,可以预测在轨单事件效应错误率。使用部分TMR和重新配置缓解方法,当重离子的表面线性能量转移为99.8 MeV.cm2 / mg,并且误差/ SEU之比为4.7431e-004时,没有观察到单事件闩锁。计算出四个不同轨道(400 km,800 km,1200 km,35784 km)的错误率,最易受伤害的轨道为1200 km轨道,平均首次错误时间为521.8天。

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