School of Mechatronics Engineering and Automation, National University of Defense Technology, ChangSha, HuNan Province, 410073, China;
School of Mechatronics Engineering and Automation, National University of Defense Technology, ChangSha, HuNan Province, 410073, China;
School of Mechatronics Engineering and Automation, National University of Defense Technology, ChangSha, HuNan Province, 410073, China;
School of Mechatronics Engineering and Automation, National University of Defense Technology, ChangSha, HuNan Province, 410073, China;
Field programmable gate arrays; Digital signal processing; Error analysis; Orbits; Single event upsets;
机译:解决在轨误差率估计中的角度单事件效应
机译:重离子核反应在确定在轨单事件错误率中的作用
机译:基于蒙特卡洛的设计锁存器对辐射的在轨单事件扰动率预测
机译:单个事件效应漏洞分析和轨道错误率预测
机译:用于空间,大气和地面辐射环境的单事件扰动分析和速率预测的灵敏体积模型。
机译:单试模型在人EEG奖励处理期间分离多重重叠预测误差
机译:单事件效应地面测试和在轨速率预测方法:过去,现在和未来