Naval Aeronautical and Astronautical University, Yantai 264001, P. R. China;
Department of Scientific Research, Naval Aeronautical and Astronautical University, Yantai 264001, P. R. China;
Circuit faults; Logic gates; Integrated circuit modeling; Dictionaries; Testing; Wires; Resistance;
机译:低渗漏遗传逻辑门的真实表的可塑性
机译:基于分析和蒙特卡罗的逻辑门仿真方法对比较逻辑门设定敏感性评价
机译:具有无限真值表的有机果冻形分形逻辑门
机译:基于逻辑门突变真理表的故障仿真方法
机译:基于查找表的现场可编程门阵列的逻辑综合
机译:具有无限真值表的有机果冻形分形逻辑门
机译:基于分析和蒙特卡罗的逻辑门仿真方法对比较逻辑门设定敏感性评价