Center for Power Electronics Systems (CPES)The Bradley Department of Electrical and Computer EngineeringVirginia Polytechnic Institute and State UniversityBlacksburg, VA 24061 USAam87@vt.edu;
Center for Power Electronics Systems (CPES)The Bradley Department of Electrical and Computer EngineeringVirginia Polytechnic Institute and State UniversityBlacksburg, VA 24061 USA;
Center for Power Electronics Systems (CPES)The Bradley Department of Electrical and Computer EngineeringVirginia Polytechnic Institute and State UniversityBlacksburg, VA 24061 USA;
Silicon Carbide (SiC); Power MOSFET; High Temperauter Characterization; Double-Pulse Test (DPT); Gate Driver;
机译:1.2 kV累积沟道和反向沟道4H-SiC MOSFET的四种电池拓扑的比较:分析和实验结果
机译:1.2-kV / 120-A Si IGBT和SiC MOSFET模块的高速栅极驱动器设计的实验比较
机译:一种使用动态短路测量技术的1.2 kV SiC MOSFET的高温表征
机译:最新一代900V和1.2kV SiC MOSFET的特性与比较
机译:6H-αSiC的热氧化电钝化及其表征和在SiC MOSFET中的应用。
机译:多芯片SIC MOSFET模块多物理仿真辅助光学测量的热阻抗表征
机译:基于实验和仿真的不同类型1.2-kV SiC晶体管短路热应力比较