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Spurious Turn-On inside a Power Module of Paralleled SiC MOSFETs

机译:并联SiC MOSFET功率模块内部的杂散开启

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摘要

Power modules with well-behaved terminal waveforms could still have their dice suffering from spurious turn-on (cross-turn-on and self-turn-on). Compared to self-turn-on, which is mainly induced by the common-source inductance, cross-turn-on deserves more attention because of its common appearance and severity for the modules with Kelvin-source connection, which has been a standard configuration for SiC module manufacturers.rnSPICE model of one commercial module is developed and verified with accuracy higher than the commercial SPICE model. The susceptibility to cross-turn-on and total switching energy for symmetrical module and asymmetrical module tailored from the commercial layouts are investigated by studying the simulated channel current of each MOSFET die and terminal current of the module in the presence of packages’ parasitic impedances. The peak cross-turn-on current of the symmetrical module is 16% of that of the asymmetrical module. Symmetrical layout greatly mitigates cross-turn-on while maintaining similar switching energy under various input voltages, low-side gate resistances, and switching currents.
机译:具有良好端子波形的电源模块的裸片可能仍会受到杂散开启的影响(交叉开启和自开启)。与主要由共源电感引起的自导通相比,交叉导通值得关注,因为它具有开尔文-源连接模块的常见外观和严重性,这已成为开尔文-源连接的标准配置。 SiC模块制造商。开发并验证了一种商用模块的SPICE模型,其精度高于商用SPICE模型。通过研究每个MOSFET管芯的模拟沟道电流和存在封装寄生阻抗的模块的终端电流,研究了根据商业布局定制的对称模块和非对称模块的交叉导通和总开关能量的敏感性。对称模块的峰值交叉开启电流为非对称模块的峰值开启电流的16%。对称布局大大减轻了交叉导通,同时在各种输入电压,低侧栅极电阻和开关电流下保持相似的开关能量。

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  • 来源
  • 会议地点 Blacksburg VA(US)
  • 作者

    Zichen Miao; Khai D. T. Ngo;

  • 作者单位

    Center for Power Electronics SystemsThe Bradley Department of Electrical and Computer EngineeringVirginia Polytechnic Institute and State UniversityBlacksburg, VA 24061 USA;

    Center for Power Electronics SystemsThe Bradley Department of Electrical and Computer EngineeringVirginia Polytechnic Institute and State UniversityBlacksburg, VA 24061 USA;

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  • 正文语种 eng
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