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Low power and high performance MOSFET

机译:低功耗高性能MOSFET

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摘要

To analysis leakage current and delay for Double Gate MOSFET with Single gate MOSFET at 45nm in CMOS Technology by using the Cadence Virtuoso simulation tool. When compared to single gate MOSFET, the leakage current and delay are observed to be reduced in double gate MOSFET. The drive current remains the same for both single and double gate MOSFET based on V but the short channel characteristics of double gate MOSFET gets improved. Double gate MOSFET is mostly recommended for low power and high performance application. When compared to bulk Si single gate device, the total power utilization of inverter, static, dynamic circuit and latch by using double gate demonstrates that leakage current and delay reduced by a factor of over 10X.
机译:使用Cadence Virtuoso仿真工具分析CMOS技术中45nm的单栅极MOSFET的双栅极MOSFET的泄漏电流和延迟。与单栅MOSFET相比,双栅MOSFET的漏电流和延迟减小了。基于V的单栅极和双栅极MOSFET的驱动电流均保持不变,但双栅极MOSFET的短沟道特性得到了改善。对于低功耗和高性能应用,大多数情况下建议使用双栅极MOSFET。与块状硅单栅极器件相比,使用双栅极的逆变器,静态,动态电路和锁存器的总功率利用率表明,泄漏电流和延迟降低了10倍以上。

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